Orientation dependence of grain-boudary critical currents in c-axis Y1Ba2Cu3O7 thin films and step-edge Josephson junctions

✍ Scribed by G. Garz; T. Schild; N. Bouadma; F.R. Ladan; P. Gabelotaud; C. Gonzalez

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 171 KB
• Volume: 235-240
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(94)91057-x

✦ Synopsis

The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of the grain boundaries can be controlled by the lattice-mismatch of substrates, the substrate temperature and oxygen pressure used during the deposition. We found that 45 °-angle grain boundaries don't show weak-link behavior characteristic of Josephson junctions.