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Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In–Ga–Zn–O Thin-Film Transistors

✍ Scribed by Chen, Wei-Tsung; Lo, Shih-Yi; Kao, Shih-Chin; Zan, Hsiao-Wen; Tsai, Chuang-Chuang; Lin, Jian-Hong; Fang, Chun-Hsiang; Lee, Chung-Chun

Book ID: 121833260
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 336 KB
Volume: 32
Category: Article
ISSN: 0741-3106
DOI: 10.1109/LED.2011.2165694

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