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Oxidation of thin CrN and Cr2N films analyzed via nuclear reaction analysis and Rutherford backscattering spectrometry

✍ Scribed by Thorsten Kacsich; Klaus-Peter Lieb

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 267 KB
Volume: 245
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90868-0

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