✦ LIBER ✦
5012. Secondary ion mass spectrometry and Rutherford backscattering spectroscopy for the analysis of thin films: W Reuter and J E E Baglin, J Vac Sci Technol, 18 (2), 1981, 282–288
- Publisher
- Elsevier Science
- Year
- 1982
- Tongue
- English
- Weight
- 178 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0042-207X
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