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Characterization of Ta2O5 layers by electron spectroscopy for chemical analysis rutherford backscattering spectrometry, nuclear reaction analysis and optical methods

✍ Scribed by K. Gu¨rtler; K. Bange; W. Wagner; F. Rauch; H. Hantsche


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
233 KB
Volume
175
Category
Article
ISSN
0040-6090

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