BIST-oriented test pattern generator for
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Takeshi Asakawa; Kazuhiko Iwasaki; Seiji Kajihara
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Article
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2003
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John Wiley and Sons
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English
β 999 KB
## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudoβrandom pattern test, we will propose a BISTβoriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is