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Detection of Defects Using Fault Model Oriented Test Sequences

✍ Scribed by M. Renovell; F. Azaïs; Y. Bertrand


Book ID
110262369
Publisher
Springer US
Year
1999
Tongue
English
Weight
264 KB
Volume
14
Category
Article
ISSN
0923-8174

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✍ Takeshi Asakawa; Kazuhiko Iwasaki; Seiji Kajihara 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 999 KB

## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudo‐random pattern test, we will propose a BIST‐oriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is