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Orientation Dependence of oxidation stacking fault density in silicon

โœ Scribed by Pekarev, A. I. ;Krasnova, G. F. ;Nemtsev, G. Z.


Book ID
105376770
Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
256 KB
Volume
76
Category
Article
ISSN
0031-8965

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