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Density functional calculations for stacking faults and grain boundaries in silicon

✍ Scribed by Teichler, H. ;Sanguinetti, S.

Book ID: 105383764
Publisher: John Wiley and Sons
Year: 1993
Tongue: English
Weight: 372 KB
Volume: 138
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211380202

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