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Optoelectronic detector probes for scanning near-field optical microscopy

✍ Scribed by H. U. DANZEBRINK


Book ID
119836387
Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
677 KB
Volume
176
Category
Article
ISSN
0022-2720

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## Abstract This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few