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Optimum simple ramp-tests for the Weibull distribution and type-I censoring

โœ Scribed by Bai, D.S.; Cha, M.S.; Chung, S.W.

Book ID
114555033
Publisher
IEEE
Year
1992
Tongue
English
Weight
550 KB
Volume
41
Category
Article
ISSN
0018-9529

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โœ Do Sun Bai; Myung Soo Kim ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 753 KB

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo