Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring

✍ Scribed by Balasooriya, U.; Low, C.-K.

• Book ID: 114668246
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 451 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.2003.821947