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Optimum ramp-stress accelerated life test for m identical repairable systems

โœ Scribed by Preeti Wanti Srivastava; Nidhi Jain


Book ID
103815431
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
227 KB
Volume
35
Category
Article
ISSN
0307-904X

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Optimum simple step-stress accelerated l
โœ Do Sun Bai; Myung Soo Kim ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 753 KB

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo