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Optimizing the formation of nickel silicide

✍ Scribed by John Foggiato; Woo Sik Yoo; Michel Ouaknine; Tomomi Murakami; Takahashi Fukada


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
223 KB
Volume
114-115
Category
Article
ISSN
0921-5107

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Nickel silicide formation on shallow jun
✍ Yu-Long Jiang; Aditya Agarwal; Guo-Ping Ru; Gary Cai; Bing-Zong Li πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 448 KB

Nickel silicide formation on shallow junctions is investigated in this paper by X-ray diffraction, micro-Raman spectroscopy, Rutherford backscattering spectroscopy, cross-sectional and plan-view transmission electron microscopy and secondary ion mass spectroscopy. A mixture of Ni 2 Si and NiSi with