Nickel silicide formation on shallow jun
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Yu-Long Jiang; Aditya Agarwal; Guo-Ping Ru; Gary Cai; Bing-Zong Li
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Article
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2005
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Elsevier Science
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English
β 448 KB
Nickel silicide formation on shallow junctions is investigated in this paper by X-ray diffraction, micro-Raman spectroscopy, Rutherford backscattering spectroscopy, cross-sectional and plan-view transmission electron microscopy and secondary ion mass spectroscopy. A mixture of Ni 2 Si and NiSi with