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Optimized conditions for the formation of buried insulating layers in Si by high dose implantation of oxygen

✍ Scribed by O.W. Holland; D. Fathy; J. Narayan; T.P. Sjoreen; S.R. Wilson


Book ID
118333198
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
517 KB
Volume
71
Category
Article
ISSN
0022-3093

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The formation of buried layers by high-d
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The availability of high-current implanters, now makes it possible to perform high-dose ion-implantations. By modifying the implant species, dose, energy and substrate temperature and by choosing the suitable thermal annealing conditions buried layers below a monocrystalline Si overlayer can be for