Micromagnetic characterization of a rota
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M. Volmer; J. Neamtu
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Article
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2008
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Elsevier Science
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English
β 204 KB
Thin films of Ni 80 Fe 20 (Permalloy) and structures as Ni 80 Fe 20 /NM/Ni 80 Fe 20 were used to build low cost rotation sensors. The structures were deposited onto oxidized Si wafers. NM denotes Cu or Al 2 O 3 layers. Angular dependencies of the planar Hall effect (PHE) are investigated for differe