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Optimization of Device Clocking Schemes to Minimize the Effects of Radiation Damage in Charge-Coupled Devices

โœ Scribed by Hall, D.J.; Gow, J.; Murray, N.J.; Holland, A.D.


Book ID
114620896
Publisher
IEEE
Year
2012
Tongue
English
Weight
419 KB
Volume
59
Category
Article
ISSN
0018-9383

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