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Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes

โœ Scribed by Sheng-Tsaing Tseng; Balakrishnan, N.; Chih-Chun Tsai


Book ID
114668778
Publisher
IEEE
Year
2009
Tongue
English
Weight
238 KB
Volume
58
Category
Article
ISSN
0018-9529

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