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Optimal design for step-stress accelerated degradation tests

✍ Scribed by Chen-Mao Liao; Sheng-Tsaing Tseng

Book ID: 114668441
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 351 KB
Volume: 55
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2005.863811

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