Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution

✍ Scribed by Hu, Cheng-Hung; Plante, Robert D.; Tang, Jen

• Book ID: 118764943
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 143 KB
• Volume: 60
• Category: Article
• ISSN: 0894-069X
• DOI: 10.1002/nav.21516