๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Optimal spatial patterns of production and decision making

โœ Scribed by Tze Hsiung Tung


Book ID
112658612
Publisher
Springer
Year
1965
Tongue
English
Weight
741 KB
Volume
15
Category
Article
ISSN
1056-8190

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Optimal burn-in decision making
โœ Taeho Kim; Way Kuo ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 97 KB ๐Ÿ‘ 2 views

This paper presents a conceptual model of burn-in decision making which gives an optimal burn-in time for semiconductor devices and describes how burn-in affects total yield and reliability. For the gate oxide of integrated circuits we consider four burn-in policies: no burn-in, wafer-level burn-in