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OPTIMAL SPATIAL PATTERNS OF PRODUCTION AND DECISION MAKING

โœ Scribed by TZE HSIUNG TUNG


Book ID
110918042
Publisher
Springer
Year
2005
Tongue
English
Weight
304 KB
Volume
15
Category
Article
ISSN
1056-8190

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Optimal burn-in decision making
โœ Taeho Kim; Way Kuo ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 97 KB ๐Ÿ‘ 2 views

This paper presents a conceptual model of burn-in decision making which gives an optimal burn-in time for semiconductor devices and describes how burn-in affects total yield and reliability. For the gate oxide of integrated circuits we consider four burn-in policies: no burn-in, wafer-level burn-in