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Optical study of Si nanocrystals in Si/SiO2 layers by spectroscopic ellipsometry

✍ Scribed by A. En Naciri; M. Mansour; L. Johann; J.J. Grob; C. Eckert

Book ID
113822721
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
348 KB
Volume
216
Category
Article
ISSN
0168-583X

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