✦ LIBER ✦

Optical studies of Si/SiO2interfaces by second-harmonic generation spectroscopy of silicon interband transitions

✍ Scribed by W. Daum

Publisher: Springer
Year: 2007
Tongue: English
Weight: 575 KB
Volume: 87
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-007-3913-0

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Studies of buried interfaces by optical

Studies of buried interfaces by optical second-harmonic generation

✍ T. Rasing 📂 Article 📅 1994 🏛 Springer 🌐 English ⚖ 593 KB

Surface second harmonic studies of Si(11

Surface second harmonic studies of Si(111)/electrolyte and Si(111)/SiO2/electrolyte interfaces

✍ P.R. Fischer; J.L. Daschbach; G.L. Richmond 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 601 KB

Diagnostics of the silicon-insulator int

Diagnostics of the silicon-insulator interface structure by optical second-harmonic generation

✍ I.V. Kravetsky; L.L. Kulyuk; A.V. Micu; D.A. Shutov; E.E. Strumban; C. Cobianu; 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 193 KB

Optical Second Harmonic Generation Studi

Optical Second Harmonic Generation Studies of Indium Deposited on Vicinal Si(111)

✍ Chandola, S. ;McGilp, J. F. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 137 KB 👁 2 views

Deposition and growth of Ag on Si(111) s

Deposition and growth of Ag on Si(111) surfaces studied by optical second-harmonic generation

✍ Pedersen, Kjeld; Tomas, Corinne; Morgen, Per 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 97 KB 👁 2 views

Optical second-harmonic generation has been used to follow in situ the growth of thin Ag Ðlms deposited on Si(111) under various substrate conditions and temperatures. This method is particularly sensitive to the microscopic structure of the deposited Ag Ðlms. Thus, island formation is found to enha

Studies of the Si/SiO2 interface by angu

Studies of the Si/SiO2 interface by angular dependent X-ray photoelectron spectroscopy

✍ Finster, J. ;Schulze, D. 📂 Article 📅 1981 🏛 John Wiley and Sons 🌐 English ⚖ 819 KB