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Optical second harmonic generation in reflection from silicon carbide films

✍ Scribed by A. Galeckas; M. Petrauskas; M. Willander; Q. Wahab

Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
194 KB
Volume
18
Category
Article
ISSN
0142-2421

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✦ Synopsis

Abstract

Second harmonic generation in reflection has been used to investigate the crystal properties of silicon carbide surfaces. By using a passively mode‐locked pulsed Nd^3+^: YAG laser the variation of the crystalline, polycrystalline and amorphous phase of silicon carbide at the surface has been investigated. The method is shown to be a sensitive and practical method to investigate the departure from perfect crystalline order at the surface.

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