𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Optical properties of WSi2 and MoSi2 single crystals as measured by spectroscopic ellipsometry and reflectometry

✍ Scribed by F Ferrieu; C Viguier; A Cros; A Humbert; O Thomas; R Madar; J.P Senateur

Publisher
Elsevier Science
Year
1987
Tongue
English
Volume
62
Category
Article
ISSN
0038-1098

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Complete optical characterization of the
Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
✍ OhlΓ­dal, I.; Franta, D.; Pinčík, E.; OhlΓ­dal, M. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 78 KB πŸ‘ 2 views

In this paper results concerning optical analysis of the SiO 2 =Si system performed by the combined ellipsometric and reflectometric method used in multiple-sample modification will be presented. This method is based on combining both the single-wavelength method and the dispersion method. Three mod