Electromigration damage is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnects. Recently, we have developed a novel and useful optical microscopy method with which we can visually observe and record such damage formation during an ac
Optical microscopy imaging method for detection of electromigration: Theory and experiment
β Scribed by Li, L. H. ;Dasika, V. ;Heskett, D. ;Tang, W. H.
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 490 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0031-8965
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β¦ Synopsis
Abstract
Electromigration is a microscopic phenomenon involving electric fieldβinduced diffusion, which is very relevant to damage in interconnects. A common method to monitor interconnect degradation is through electrical resistance measurements, which requires direct electrical contacts. It is desirable to develop nonβcontact methods to monitor electromigration damage formation. Recently, we have proposed a novel Optical Microscopy Imaging Method (OMIM). Here we provide theoretical proof and additional experimental results. OMIM provides a new method for studying electromigrationβinduced damage. (Β© 2007 WILEYβVCH Verlag GmbH & Co. KGaA, Weinheim)
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