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4800494 Method and apparatus for execution of multislice imaging experiments

✍ Scribed by David L Foxall


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
99 KB
Volume
8
Category
Article
ISSN
0730-725X

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## Abstract Electromigration is a microscopic phenomenon involving electric field‐induced diffusion, which is very relevant to damage in interconnects. A common method to monitor interconnect degradation is through electrical resistance measurements, which requires direct electrical contacts. It is