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Optical investigation of interface roughness and defect incorporation in GaAs/AlGaAs quantum wells grown with and without growth interruption

✍ Scribed by Gurioli, M.; Vinattieri, A.; Colocci, M.; Bosacchi, A.; Franchi, S.

Book ID: 111691729
Publisher: American Institute of Physics
Year: 1991
Tongue: English
Weight: 641 KB
Volume: 59
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.106109

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