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Optical characterization of surface roughness of diamond by spectroscopic ellipsometry

✍ Scribed by Kumagai, N.; Yamasaki, S.; Okushi, H.


Book ID
124113461
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
311 KB
Volume
13
Category
Article
ISSN
0925-9635

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## Abstract Nominally undoped AlAs__~x~__ Sb~1–__x__~ layers with a thickness of 200 nm to 370 nm and arsenic mole fraction __x__ of 0.325–0.872 were grown on Fe‐doped (001) InP substrates by solid‐source molecular beam epitaxy. Their optical properties were investigated over a wide photon range o