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Optical and structural analysis of porous silicon coated with GZO films using rf magnetron sputtering

✍ Scribed by R. Prabakaran; T. Monteiro; M. Peres; A.S. Viana; A.F. da Cunha; H. Águas; A. Gonçalves; E. Fortunato; R. Martins; I. Ferreira

No coin nor oath required. For personal study only.

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