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Optical and physical characterization of SiO2-x-Al thin-film polarizer on x-cut LiNbO3 substrate

✍ Scribed by Miyama, Y.; Nagata, H.

Book ID
115370189
Publisher
Optical Society of America
Year
2001
Tongue
English
Weight
195 KB
Volume
19
Category
Article
ISSN
0733-8724

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## Abstract As a precursor material for electrooptical applications in the integrated optics, nominal pure as well as Zn‐doped stoichiometric LiNbO~3~ thin films of a few Β΅m thickness were grown by liquid phase epitaxy on congruent LiNbO~3~ substrates. The crystalline perfection and lattice paramet