𝔖 Bobbio Scriptorium

✦ LIBER ✦

Online cylindricity measurement and error compensating control in ultra-precision lathe: Li Sheng-Yi; Qin Ming-Nuan; Li, C. J. SPIE — Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 991–994

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 135 KB
Volume: 16
Category: Article
ISSN: 0141-6359
DOI: 10.1016/0141-6359(94)90166-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Problems and solving methods of on-line

Problems and solving methods of on-line measuring straightness: Liang Jian-Cheng; Li Sheng-Yi; Yang Shu-Zi. Proceedings of the SPIE - The International Society for Optical Engineering Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 1081–1084

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 129 KB

Research on in-process evaluating balanc

Research on in-process evaluating balance precision of grinder wheels: Mu De-Qiang; Ji Qing-Fa. SPIE - Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 1176–1178

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 129 KB

On-line high precision intelligent measu

On-line high precision intelligent measurement of straightness based on dense sampling: Shi Wang-Yuan; Wang Chun-Hai; Cheng Qi-Chang. SPIE — Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 986–990

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 135 KB

Nanometer movement and nanometer metrolo

Nanometer movement and nanometer metrology-A review of realization methods: Hong Wei; Davis, E. J.; Stout, K. J. SPIE — Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 876–885

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 142 KB

Flatness measurement of a very large dia

Flatness measurement of a very large diameter plate on a machine tool by error separation method: He Zhen; Liu Xin-Zhan; Liang Jin-Wen. SPIE — Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 499–504

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 130 KB