𝔖 Bobbio Scriptorium
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On-line high precision intelligent measurement of straightness based on dense sampling: Shi Wang-Yuan; Wang Chun-Hai; Cheng Qi-Chang. SPIE — Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 986–990


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
135 KB
Volume
16
Category
Article
ISSN
0141-6359

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