The accuracy of XPS and AES quantiΓcation by peak shape analysis was established from a detailed analysis of a range of model spectra and three sets of experiments. It was found that information on the concentration-depth proΓle in the surface region up to depths of (where is the inelastic electron
On the XPS peak shape analysis
β Scribed by M. Sreemany; T.B. Ghosh
- Book ID
- 103617627
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 680 KB
- Volume
- 81
- Category
- Article
- ISSN
- 0169-4332
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