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In-depth concentration profile information through analysis of the entire XPS peak shape

✍ Scribed by S. Tougaard

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 290 KB
Volume: 32
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(88)90018-9

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