On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part II: experimental results and the effects of stress conditions

✍ Scribed by Wu, E.Y.; Sune, J.; Lai, W.

• Book ID: 114616919
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 667 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.805603