On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part I: theory, methodology, experimental techniques

✍ Scribed by Wu, E.Y.; Vollertsen, R.-P.

• Book ID: 111916251
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 474 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.805612