On Voltage Acceleration Models of Time to Breakdown—Part II: Experimental Results and Voltage Dependence of Weibull Slope in the FN Regime

✍ Scribed by Wu, E.Y.; Sune, J.

• Book ID: 114619666
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 373 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2021725