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On the theoretical calculation of the intensity distribution in X-ray section topographs of crystals with superposed films

✍ Scribed by Filscher, G.


Publisher
John Wiley and Sons
Year
1976
Tongue
English
Weight
88 KB
Volume
33
Category
Article
ISSN
0031-8965

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The X-ray topographic investigation of d
✍ Dr. M. Ya. Dashevsky; V. A. Isaakyan; M. A. Khatsernov πŸ“‚ Article πŸ“… 1973 πŸ› John Wiley and Sons 🌐 English βš– 201 KB πŸ‘ 2 views

## Abstract Using the modified method of limited X‐ray topographs the distribution of defects along the silicon dendritic thickness was investigated. It is found that there are two dislocation sources in the given crystals, one of which acts near the surface and generates the loop‐shaped dislocatio