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X-ray diffraction of Langmuir-Blodgett films: Establishing a new method for the calculation of electron density distributions from a single set of intensity data

✍ Scribed by Matthias Von Frieling; Hans Bradaczek; William S. Durfee


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
406 KB
Volume
159
Category
Article
ISSN
0040-6090

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