Techniques to extract focus properties of microscopy images are many and varied. Many of them, however, rely on the summation of local statistical properties. Presented here is a n examination of conventional focus determination algorithms, and a new method based on planar histograms of these local
On the statistical analysis of images in low-dose electron microscopy
โ Scribed by C.H. Slump; H.A. Ferwerda; B.J. Hoenders
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 179 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0304-3991
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Zero-mean noise introduced into quadrature detected MRI signals is generally rectified by the reconstruction algorithm to give a nonzero background intensity in the displayed image. In low signal-to-noise ratio (SNR) images, this background will inflate region of interest (ROI) signal measurements,
The effect of electron beam irradiation, followed by chemical treatment, on the macromolecular structure and crosslinking parameters in low density polyethylene (LDPE) films has been studied through scanning electron microscopy (SEM). The electron beam irradiation with low doses increases the co-ope
A method of crystal structure determination by electron crystallographic image processing based on the combination of high-resolution electron microscopy (HREM) and electron diffraction is introduced. It consists of two stages: image deconvolution and resolution enhancement. In the first stage an i