๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

On the use of local statistical properties in focusing microscopy images

โœ Scribed by Alan Lipton; Dr. Edmond J. Breen


Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
825 KB
Volume
31
Category
Article
ISSN
1059-910X

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โœฆ Synopsis


Techniques to extract focus properties of microscopy images are many and varied. Many of them, however, rely on the summation of local statistical properties. Presented here is a n examination of conventional focus determination algorithms, and a new method based on planar histograms of these local statistical properties. It is shown that this new method provides finer discernment of the focus properties of an image, and provides a means to extend the focus of an Image analysis, Automated focusing, Extended focus, Image focus optical microscopy system.


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