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On the spread of time-to-failure measurements in thin metallic films

✍ Scribed by A. Bobbio; O. Saracco

Book ID: 107859950
Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 192 KB
Volume: 17
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(73)90016-3

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