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On the oxide interface micro-roughness in MOS devices

✍ Scribed by I Placencia; J Suñé; E Farrés; N Barniol; X Aymerich

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 342 KB
Volume: 39
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(89)90034-1

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