On the determination of the electronic properties of the inaccessible thin film semiconductor-solid substance interface by the MIS capacitance method

✍ Scribed by V. Šnejdar; J. Jerhot

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 385 KB
• Volume: 26
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(75)90148-0