✦ LIBER ✦
A channel conductance measuring technique for determining the interface properties of a SiO-InSb thin film transistor : A. van Calster. Solid-St. Electron. 21, 393 (1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 127 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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