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On the determination of crystal and counter settings for a single-crystal X-ray diffractometer

✍ Scribed by Arndt, U. W. ;Phillips, D. C.


Book ID
114517250
Publisher
International Union of Crystallography
Year
1957
Tongue
English
Weight
360 KB
Volume
10
Category
Article
ISSN
0365-110X

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X-ray crystal orientation determination
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## Abstract An improved method to measu reorientation angles of flat single crystals was developed taking Buerger precession technique. The method is described and compared with Laue‐ and goniometer techniques. Advantages are low costs and short measuring time. An easy evaluation of the records all