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On the Determination of Charge Profiles in Epitaxial Layers of ZnSe by Capacitance Measurements

✍ Scribed by M. Germain; R. Evrard; S. Lampe; M. Heuken

Book ID: 107457773
Publisher: Springer US
Year: 1998
Tongue: English
Weight: 102 KB
Volume: 27
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-998-0183-3

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