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Determination of epitaxial-layer impurity profiles by means of microwave-diode measurements

✍ Scribed by H. Kressel; M.A. Klein

Book ID
103388649
Publisher
Elsevier Science
Year
1963
Tongue
English
Weight
217 KB
Volume
6
Category
Article
ISSN
0038-1101

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Determination of vertical temperature profiles for the atmospheric boundary layer by ground-based microwave radiometry
✍ Bernd SchΓΆnwald πŸ“‚ Article πŸ“… 1978 πŸ› Springer 🌐 English βš– 494 KB

A useful method for remote sensing of vertical temperature profiles in the atmospheric boundary layer is described. From angular measurements of brightness temperature at 58 GHz, profiles have been inferred up to an altitude of 700m. Calculations were done with an iterative inversion procedure (Smit